TTTC: Test Vision 2020 Call for Participation

Advance Discount Registration Deadline June 23rd, 2012!

CALL FOR PARTICIPATION

Scope -- Key Dates -- Workshop Registration -- More Information

Scope

Attend the annual Test Vision Workshop held in conjunction with Semicon West to learn what’s being done to tackle the industry’s next big challenges head‐on. Hear from peers and experts on topics including: stacked die testing, MEMs device testing, System Level Testing and more.

Test Vision 2020 invites you participate in the industry’s top‐rated IEEE test workshop on July 11 and 12th during SEMICON West in San Francisco. Test Vision 2020, formerly the ATE Vision 2020 Workshop, is the premier workshop in the area of Semiconductor Test and promises lively discussion and an exciting lineup of papers, panels and presentations. The theme of this year's workshop is "Next Frontiers in Test" with a focus on test challenges emerging from new devices, such as MEMs, new integration methodologies, such as TSVs, System Level Testing and a look at new economic drivers to meet ever‐lowering cost points for consumer devices. The program provides an opportunity to learn about cutting edge topics. Highlights of the program include:

Keynote Speaker: Bill Bottoms, Industry veteran and chairman, SBA Materials - Ensuring reliability for electronic components and systems when everything is changing

Invited Speaker: Dr. Mike Gaitan, Group Leader, NIST - MEMS Technology Roadmapping and
testing challenges

Panels:
Convergence of System Level Testing with Standard Manufacturing Test
A Look at the Life of Test Engineers in the Year 2022

Paper Topics:
System Level Testing
Advances in MEMs Testing
Advances in ATE and Test Efficiency
3D/TSV Testing

Key Dates

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Advance Discount Registration Deadline: June 23rd, 2012!

Workshop Registration

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Take advantage of extended early bird registration fees and save $95 until June 23rd, 2012. Register for
the workshop here.

More Information

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For more information on the workshop or to find out more about the exciting program, contact the
workshop General Chair, Dave Armstrong at d.armstrong@advantest.com or Program Chair, Ajay Khoche
at akhoche@gmail.com.

For more information, visit us on the web at: http://www.testvision2020.com

The Test Vision 2020 Workshop is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC).